Effective surface resistivity through image analysis
US7251419B2 · kind B2 · utility
1Cited by
2References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 22, 2005 |
| Grant date | Jul 31, 2007 |
| Priority date | — |
| Expiry date | Dec 15, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G2221/1639
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for determining the approximate surface conductivity of a photoreceptor surface. The method involves forming a latent image of a series of lines of different widths on the surface, developing the image, and then printing the image. Based on which lines print, the surface conductivity can be computed once the developability of isolated lines is established through a calibration procedure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.