Thermometry probe calibration method
US7255475B2 · kind B2 · utility
33Cited by
49References
4Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 12, 2005 |
| Grant date | Aug 14, 2007 |
| Priority date | — |
| Expiry date | Oct 12, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.