Application of statistical inference to optical time domain reflectometer data
US7256878B1 · kind B1 · utility
10Cited by
2References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 15, 2006 |
| Grant date | Aug 14, 2007 |
| Priority date | — |
| Expiry date | May 15, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3145
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.