Patent · US Expired

Method for programming and/or testing for correct functioning of an electronic circuit

US7257748B2 · kind B2 · utility

0Cited by

6References

8Claims

0Family size

Assignee

Robert Bosch GmbH · DE

Inventors

Ruediger Giesel · Stuttgart, DE
Dieter Seifert · Vilshofen an der Donau, DE
Rene Wolf · Schwieberdingen, DE
Ralf Henne · Sachsenheim, DE

Key dates

Filing date	Feb 3, 2003
Grant date	Aug 14, 2007
Priority date	—
Expiry date	Nov 17, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2815
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Proposed is a method for programming and/or testing for the correct functioning of an electronic circuit, and a corresponding device, which is used to efficiently program and test electronic circuits combined on a wafer, prior to their separation. For this purpose, a bus allowing the individual electronic circuits to be sequentially tested is positioned on the wafer. Each electronic circuit is assigned an address for the bus, using a hardware code. The address is deactivated after completion of the functionality and testing method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.