Patent · US Expired

Process measuring point

US7259848B2 · kind B2 · utility

1Cited by

10References

13Claims

0Family size

Assignee

Endress+Hauser Conducta Gesellschaft fuer Mess- und Regeltechnik mbH + Co. KG · DE

Inventors

Detlev Wittmer · Maulbronn, DE
Wolfgang Babel · Linz, DE

Key dates

Filing date	Jun 25, 2002
Grant date	Aug 21, 2007
Priority date	—
Expiry date	Feb 3, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG01J3/0291
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A process for measuring a point comprising at least one spectrometer and a measuring transducer connected thereto for picking up, processing and forwarding measuring signals from the spectrometer, the spectrometer being arranged in an armature for introduction into a process or a process fluid and the data produced by the spectrometer is used to control a process. The armature comprises a housing for receiving the spectrometer and for securing the armature to a process container containing process fluid and a sensor holder with an inbuilt sensor, interacting with the spectrometer and which is guided in an axially displaceable manner in the armature, whereby the sensor holder protrudes into the process fluid in an extended state.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.