SINR measurement method for OFDM communications systems
US7260054B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 30, 2002 |
| Grant date | Aug 21, 2007 |
| Priority date | — |
| Expiry date | May 2, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L27/2647
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A signal to interference-plus-noise power ratio (SINR) measurement method for wireless communications systems which employ orthogonal frequency division multiplexing (OFDM) for multicarrier data transmission is disclosed. Fast-Fourier transform (FFT)-based SINR measurements can be computed on frame-by-frame or greater interval for individual or groupings of subchannel signals. Given a known transmitted time-domain OFDM frame preamble, and the corresponding channel and interference-plus-noise (IPN) corrupted received time-domain frame preamble, the disclosed method first computes the power spectral densities of the received signal of interest and of a received unwanted interference-plus-noise signal. The FFT-computed power spectral densities are then used to compute average received signal and received IPN power measurements for specified individual or groupings of OFDM subchannel signals. The power measurements are then frame-averaged using a recursive exponential smoothing method. The frame-averaged signal and IPN power measurements are then used to form quantized measurements of SINR for the specified OFDM subchannel signals of the received frame.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.