Diffractometer and method for diffraction analysis
US7260178B2 · kind B2 · utility
1Cited by
7References
15Claims
0Family size
Assignee
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Key dates
| Filing date | Jan 21, 2003 |
| Grant date | Aug 21, 2007 |
| Priority date | — |
| Expiry date | Jan 21, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception axis, said collimation and reception axis, conveying in a centre of the diffractometer which is fixed with respect to the primary Euler cradle. The source and detector are adapted to move along the primary Euler cradle. The secondary Euler cradle supports the primary Euler cradle and is arranged to rotate the latter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.