Test system and method for scheduling and running multiple tests on a single system residing in a single test environment
US7260184B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 25, 2003 |
| Grant date | Aug 21, 2007 |
| Priority date | — |
| Expiry date | Mar 25, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04M1/24
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A test system and method for scheduling and running multiple tests on a single system residing in a single test environment. The test system comprises a processor operable to receive a request to run a selected test on the system at a selected start time, and determine a time slot for the selected test. The test system is also operable to identify any scheduled tests to be run on the system within the time slot, and identify any conflicts between the selected test and any scheduled tests. If no scheduled tests are identified or if no conflicts are identified, the processor is operable to schedule the selected test to run on the system at the selected start time. If conflicts are identified, the processor is preferably operable to determine an alternative start time for the selected test that avoids any conflicts. Various exemplary embodiments of the test system and associated method are provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.