Patent · US Expired

3D interconnect with protruding contacts

US7262495B2 · kind B2 · utility

332Cited by
15References
43Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 2004
Grant dateAug 28, 2007
Priority date
Expiry dateAug 3, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/15788
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

This invention relates to a semiconductor having protruding contacts comprising, a first semiconductor substrate having at least one interconnect located substantially within the first substrate, and a second semiconductor substrate having at least one protruding contact point that substantially contacts at least one interconnect.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.