Method for the contactless determination of a layer thickness via resistance and inductance measurement of a sensor oil
US7262596B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2005 |
| Grant date | Aug 28, 2007 |
| Priority date | — |
| Expiry date | Sep 9, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
With a method for the contactless determination of a thickness of a layer (20) made of electrically-conductive material of a component (17), a sensor composed of a coil form (13) and a coil (14) is positioned in the vicinity of the component (17) to be measured. The method is based on a combination of the principles of induction and eddy current. The thickness of the layer (20) is determined using a plurality of measuring and evaluation steps in which the coil (14) is acted upon with a first alternating current frequency f and its inductance and resistance values are evaluated. The distance between the coil form (13) and, therefore, the coil (14), and the component (17) is derived from the resistance value R of the coil (14) acted upon with alternating current frequency f.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.