Patent · US Expired

Systems and methods for measurement optimization

US7262859B2 · kind B2 · utility

48Cited by
15References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 13, 2005
Grant dateAug 28, 2007
Priority date
Expiry dateDec 27, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/6478
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to methods and systems for detecting and or analyzing an agent in a sample with a chip having optical components incorporated therein.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.