Methods and systems for tuning write strategy parameters of an optical storage device
US7263050B2 · kind B2 · utility
4Cited by
6References
21Claims
0Family size
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Key dates
| Filing date | Dec 16, 2005 |
| Grant date | Aug 28, 2007 |
| Priority date | — |
| Expiry date | Dec 31, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B20/1426
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system, for tuning a plurality of write strategy parameters of an optical storage device, includes: a run-length limited (RLL) meter for detecting a plurality of lengths, each length corresponding to a pit or a land on an optical storage medium accessed by the optical storage device; and a calculation module coupled to the RLL meter for performing calculations according to the lengths to generate a plurality of calculation results; wherein the write strategy parameters are tuned according to the calculation results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.