Patent · US Expired

Methods and systems for estimation of personal characteristics from biometric measurements

US7263213B2 · kind B2 · utility

155Cited by
214References
27Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 9, 2004
Grant dateAug 28, 2007
Priority date
Expiry dateMay 8, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V40/1318
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Methods and apparatus are provided for estimating a personal characteristic of an individual. A biometric data measurement is collected from the individual. The personal characteristic is determined by applying an algorithmic relationship between biometric data measurements and values of the personal characteristic derived from application of a multivariate algorithm to previous measurements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.