Method for determining poor performing cells
US7263449B1 · kind B1 · utility
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13References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 17, 2004 |
| Grant date | Aug 28, 2007 |
| Priority date | — |
| Expiry date | Mar 19, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/396
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A means for determining long-term discharge performance, particularly in a lithium/silver vanadium oxide cell, by analyzing and characterizing the initial pulse voltage waveform, is described. The relationship between the initial P1 (Pmin) voltage drop and the extent of that initial voltage drop with Plast (the final voltage under load) is a reliable indication of long-term discharge performance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.