Patent · US Expired

Method and apparatus for modeling devices having different geometries

US7263477B2 · kind B2 · utility

30Cited by
3References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 9, 2003
Grant dateAug 28, 2007
Priority date
Expiry dateApr 24, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/367
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention includes a method for modeling devices having different geometries, in which a range of interest for device geometrical variations is divided into a plurality of subregions each corresponding to a subrange of device geometrical variations. The plurality of subregions include a first type of subregions and a second type of subregions. The first or second type of subregions include one or more subregions. A regional global model is generated for each of the first type of subregions and a binning model is generated for each of the second type of subregions. The regional global model for a subregion uses one set of model parameters to comprehend the subrange of device geometrical variations corresponding to the G-type subregion. The binning model for a subregion includes binning parameters to provide continuity of the model parameters when device geometry varies across two different subregions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.