Method and x-ray system for determination of position of an x-ray source relative to an x-ray image detector
US7264397B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 2, 2006 |
| Grant date | Sep 4, 2007 |
| Priority date | — |
| Expiry date | Aug 2, 2026 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/583
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
In a method and x-ray system for determination of the relative position of an x-ray source relative to an x-ray image detector, a reference structure in a known position relative to the x-ray source is introduced into the beam path between the x-ray source and the x-ray image detector. The x-ray image detector acquires an x-ray image with the map of the reference structure. The position of the map of the reference structure in the x-ray image is determined by a computer and the position of the reference structure relative to the x-ray image detector is determined therefrom. The position of the x-ray source relative to the x-ray image detector is determined from this relative position of the reference structure to the x-ray image detector and from the position of the reference structure to the x-ray source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.