Method and apparatus for measuring assembly and alignment errors in sensor assemblies
US7265881B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 20, 2002 |
| Grant date | Sep 4, 2007 |
| Priority date | — |
| Expiry date | Oct 3, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2201/04794
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A target, method, and apparatus are disclosed for measuring assembly and alignment errors in scanner sensor assemblies. The sensor assembly comprises at least two sensor segments. The target comprises edges defined by changes in reflectance. At least one vertical edge corresponds to each sensor segment, and can be detected only by its corresponding segment, even when the segments are misaligned to the maximum extent of their placement tolerances. The target may optionally comprise a horizontal edge spanning the sensor segments. The target is scanned, and the resulting digital image is analyzed to detect the apparent locations of the target edges. The apparent edge locations provide sufficient information to locate the sensor segments. The target may optionally be incorporated into a scanner, or into a separate alignment fixture. The analysis may be performed in a scanner, in a fixture, or in a host computer attached to a scanner or a fixture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.