Patent · US Expired

Control of delay line interferometer

US7266311B2 · kind B2 · utility

11Cited by

2References

12Claims

0Family size

Assignee

LUCENT TECHNOLOGIES INC. · US

Inventors

Herbert Haunstein · Dormitz, DE
Ralph Schlenk · Bad Abbach, DE

Key dates

Filing date	Sep 29, 2004
Grant date	Sep 4, 2007
Priority date	—
Expiry date	Mar 9, 2026

Classification

Technology area (CPC H)Electricity
CPC primaryH04B10/66
WIPO fieldOptics
WIPO sectorInstruments

Abstract

The delay setting of an optical delay line interferometer (DLI) used to decode differentially encoded phase shift keyed signals (DPSK or DQPSK) is controlled using a control signal representative of the ratio Perr2/Perr1 of the rate of occurrence of double errors and the rate of occurrence of errors. The ratio Perr2/Perr1, as the delay setting of the DLI is varied, exhibits a characteristic W-shaped structure consisting of a local maximum at the optimum value and two minima adjacent to the maximum, one on each side of it. This structure is present over a wide range of signal to noise ratio and residual dispersion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.