Scanning SQUID microscope having position noise compensation
US7268542B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 16, 2005 |
| Grant date | Sep 11, 2007 |
| Priority date | — |
| Expiry date | Mar 22, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S505/846
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning SQUID microscope is set forth to provide improved output imaging. The SQUID microscope includes a vertically adjustable housing adapted to securely retain a SQUID loop or sensor. A scanning stage of the SQUID microscope is adapted to support a sample while moving the sample along a predetermined path to selectively position predetermined portions of the sample in close proximity to the SQUID loop or sensor to permit the loop or sensor to detect predetermined magnetic field information provided by the predetermined portions of the sample. A position control processor coupled to the scanning stage is operative to receive and process the predetermined magnetic field information to provide corresponding position noise information. Criteria are also presented for determining the expected level of position noise under given experimental conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.