Wear monitoring system with embedded conductors
US7270890B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 20, 2004 |
| Grant date | Sep 18, 2007 |
| Priority date | — |
| Expiry date | Jul 20, 2025 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/24273
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Aspects of the invention relate to a system for monitoring the wear of a component. A conductor can be embedded in the component at a depth from a surface of the component. In one embodiment, the conductor can be operatively connected to a power source to form an electrical circuit. The resistance across the conductor can be measured. As the component contacts a second component, the component can begin to wear. Once the wear progresses to the conductor, changes in the measured resistance can result. Thus, an operator can be alerted that the component has worn to a certain point and that service may be needed. Alternatively, impedance can be measured across the conductor. Because the dielectric permeability of the material surrounding the conductor can affect impedance, changes in impedance can occur as the surface material of the component is worn away.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.