Oscilloscope based return loss analyzer
US7271575B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 7, 2003 |
| Grant date | Sep 18, 2007 |
| Priority date | — |
| Expiry date | Nov 8, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/22
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system, apparatus and method for performing differential return loss measurements and other measurements as a function of frequency uses a digital storage oscilloscope (DSO) having spectral analysis functions. A waveform generator generates a differential test signal in the form of a series of pulses where each pulse includes spectral components associated with each of a plurality of frequencies of interest. A test fixture presents the differential test waveform to a load including at least one of a device under test (DUT), a short circuit, an open circuit and a balanced load. A signal acquisition device differentially measures the test waveform during each of the load conditions. The signal acquisition device computes an error correction parameter using measurements made during the short circuit, open circuit and balanced load conditions. The correction parameter tends to offset signal acquisition errors within measurements made during the DUT load condition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.