Measurement of phase nonlinearity of non-linear devices
US7272521B1 · kind B1 · utility
3Cited by
2References
5Claims
0Family size
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Key dates
| Filing date | Feb 15, 2005 |
| Grant date | Sep 18, 2007 |
| Priority date | — |
| Expiry date | Feb 18, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining the phase characteristics of a nonlinear analog device includes application of a test signal, which may be linear-FM, to the nonlinear device. The converted signal is digitized and mathematically converted to baseband in ideal fashion. A digitized version of the original test signal and the downconverted signal are phase compared to determine the phase error.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.