Method and apparatus for measuring a thickness of a thin film in motion
US7272972B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 24, 2005 |
| Grant date | Sep 25, 2007 |
| Priority date | — |
| Expiry date | Oct 12, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/0691
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for monitoring a thickness of a film in motion. The apparatus comprises a roller for receiving and supporting the film in motion, the roller being adapted to rotate about an axis of rotation. The apparatus also comprises a position detector for detecting when the roller is in a specific angular position as the roller rotates about the axis of rotation. The apparatus further comprises a measurement unit aligned with a specific portion of the roller and coupled to the position detector. The measurement unit is responsive to a detection of the roller being in the specific angular position to measure the thickness of the film.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.