Measuring method and instrument comprising image sensor
US7274829B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 9, 2001 |
| Grant date | Sep 25, 2007 |
| Priority date | — |
| Expiry date | Apr 10, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/5957
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A linearizing correction unit (104) carries out a linearizing correction process on the output of an image sensor (8) based upon linearizing correction data stored in a linearizing correction data holding unit (102), and a light-irregularity correction unit (108) carries out a light-irregularity correction process on the image sensor output that has been subjected to the linearizing correction process based upon light-irregularity correction data stored in a light-irregularity correction data holding unit (106). A refection factor calculation unit (110) calculates an integral value of the in-plane reflection factor of a test piece by using the output that has been subjected to the linearizing correction and light-irregularity correction with respect to pixel outputs of the image sensor (8) obtained when the test piece having in-plane density irregularities is measured. A quantifying unit (114) applies calibration curve data of a calibration-curve-data holding unit (112) to the integrated reflection factor obtained by the reflection factor calculation unit so that a sample density of the test piece is calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.