Patent · US Expired

Method and device for determining motion parameters of a conductive, profiled surface

US7275015B2 · kind B2 · utility

0Cited by

2References

28Claims

0Family size

Assignee

MICRO-EPSILON-MESSTECHNIK GMBH & CO. KG · DE

Inventors

Stanislav Medinkov · Ortenburg, DE
Mark Netchaewskij · Samara, RU
Felix Mednikov · Ortenburg, DE
Werner Grommer · Ortenburg, DE
Martin Sellen · Dordrecht, NL

Key dates

Filing date	Oct 25, 2005
Grant date	Sep 25, 2007
Priority date	—
Expiry date	Oct 26, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG01P3/488
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and a device for determining motion parameters of a conductive, profiled surface (22) relative to a sensor (3), with the sensor (3) comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface (22) and the sensor (3), to a variation, which is determined by means of the coil (16). The position change is derived from the coupling impedance (Zc) of the coil (16), and the real component (Rc) and the imaginary component (Xc) of the complex coupling impedance (Zc) of the coil (16) are determined, with a distance d between the sensor (3) and the surface (22) being computed based on the determined values while using an algorithm as a basis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.