Device for a goniometric examination of the optical properties of surfaces
US7276719B2 · kind B2 · utility
14Cited by
1References
40Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 6, 2005 |
| Grant date | Oct 2, 2007 |
| Priority date | — |
| Expiry date | Jul 6, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8806
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for examining the optical properties of surfaces having at least one first radiation device emitting radiation at least at one first predetermined spatial angle to a surface to be examined, at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the detector device allows a local resolution of detected radiation and is positioned at least at a second predetermined spatial angle relative to the surface. At least one spatial angle at which the radiation device and/or the detector device are positioned, is variable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.