Patent · US Expired

Junction-isolated vias

US7276794B2 · kind B2 · utility

7Cited by
10References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 2, 2005
Grant dateOct 2, 2007
Priority date
Expiry dateJul 28, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/14
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for forming a junction-isolated, electrically conductive via in a silicon substrate and a conductive apparatus to carry electrical signal from one side of a silicon wafer to the other side are provided. The conductive via is junction-isolated from the bulk of the silicon substrate by diffusing the via with a dopant that is different than the material of the silicon substrate. Several of the junction-isolated vias can be formed in a silicon substrate and the silicon wafer coupled to a second silicon substrate of a device that requires electrical connection. This process for forming junction-isolated, conductive vias is simpler than methods of forming metallized vias, especially for electrical devices more tolerant of both resistance and capacitance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.