Measuring spectral lines from an analyte using multiplexed holograms and polarization manipulation
US7277210B2 · kind B2 · utility
19Cited by
4References
49Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 21, 2005 |
| Grant date | Oct 2, 2007 |
| Priority date | — |
| Expiry date | May 1, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2222/31
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical apparatus in which multiplexed holograms are used to achieve wavelength selectivity and polarization manipulation is used to facilitate near-normal incidence of light on the holograms. The polarization manipulation allows light reflected from the holograms to be separated from the light incident on the holograms. In one application, the apparatus can be used to extract spectral lines of an analyte from radiation scattered from a sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.