Substrate for the micro-lithography and process of manufacturing thereof
US7279252B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 7, 2004 |
| Grant date | Oct 9, 2007 |
| Priority date | — |
| Expiry date | Jun 3, 2025 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y40/00
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
The invention relates to the manufacture of a substrate which is particularly suitable for EUV micro-lithography and comprises a base layer of low coefficient of thermal expansion (CTE) onto which at least one cover layer made of a semiconductor material is applied. Preferably, the cover layer is a silicon layer, preferably applied by ion beam sputtering. By an additional ion beam figuring treatment substrates of extremely accurate shape and extremely low roughness can be prepared.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.