Patent · US Expired

Method for fabricating cell transistor of flash memory

US7279381B2 · kind B2 · utility

1Cited by
1References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 12, 2005
Grant dateOct 9, 2007
Priority date
Expiry dateSep 4, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B41/30

Abstract

A method for fabricating a cell transistor of a flash memory including a device isolation film is disclosed, to prevent the mouse bite and the residue of a gate electrode, which includes the steps of forming a moat pattern of STI structure on a semiconductor substrate; forming a shallow trench by etching the semiconductor substrate exposed by the moat pattern; forming a gap-fill insulating layer in the shallow trench by HDP; forming the device isolation film of STI structure in the shallow trench by etching the gap-fill insulating layer with CMP; forming a flash cell pattern for opening an area for flash memory cell transistor in the semiconductor substrate; and removing the flash cell pattern and the moat pattern after etching the upper surface of the device isolation film in the area being opened by the flash cell pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.