Dual arcuate blade probe tip
US7279912B2 · kind B2 · utility
6Cited by
9References
34Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 13, 2005 |
| Grant date | Oct 9, 2007 |
| Priority date | — |
| Expiry date | Nov 3, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06738
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a dual arcuate blade probe tip for probing a node, such as a node hole, on a circuit. The probe has a shaft made from an electrically conductive material, concentric to a longitudinal probe axis, and two separate arcuate edges coupled to the shaft and positioned transverse to the probe axis. The arcuate edges define a self-cleaning space therebetween, avoiding blockage of the probe by debris. The arcuate edges provide two single points of contact to concentrate applied force from the shaft to the node hole. The shaft may also include a plunger and/or a structure to prevent rotation of the probe about the probe axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.