Patent · US Expired

Apparatus for determining wall thickness of microcapsule

US7280231B2 · kind B2 · utility

1Cited by
3References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 5, 2004
Grant dateOct 9, 2007
Priority date
Expiry dateFeb 6, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/1493
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A thickness-determining apparatus for determining a wall thickness of a microcapsule having a refractive index n1 comprises a sensor 1 for detecting a light scattering intensity data I1 with respect to the microcapsule dispersed in a medium having a refractive index n1, and a light scattering intensity data I2 with respect to the microcapsule dispersed in a medium having a refractive index n2; a memory circuit 3 for storing a theoretical equation correlating a light scattering intensity characteristic with a particle size; and an arithmetic circuit 5 for calculating an inner diameter r1 and an outer diameter r2 from the theoretical equation based on the light scattering intensity data I1 and I2, and calculating the wall thickness.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.