Patent · US Expired

Integrated resistance cancellation in temperature measurement systems

US7281846B2 · kind B2 · utility

71Cited by
18References
31Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 23, 2004
Grant dateOct 16, 2007
Priority date
Expiry dateAug 23, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K7/01
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A temperature measurement device may be implemented by coupling a PN-junction, which may be comprised in a diode, to an analog-to-digital converter (ADC) that comprises an integrator. Different currents may be successively applied to the diode, resulting in different VBE values across the diode. The ΔVBE values thus obtained may be successively integrated. Appropriate values for the different currents may be determined based on a set of mathematical equations, each equation relating the VBE value to the temperature of the diode, the current applied to the diode and parasitic series resistance associated with the diode. When the current sources with the appropriate values are sequentially applied to the diode and the resulting diode voltage differences are integrated by the integrator comprised in the ADC, the error in the temperature measurement caused by series resistance is canceled in the ADC, and an accurate temperature reading of the diode is obtained from the output of the ADC.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.