Measurement and control of high frequency banding in a marking system
US7283143B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 25, 2004 |
| Grant date | Oct 16, 2007 |
| Priority date | — |
| Expiry date | May 2, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/00087
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of measuring and controlling high frequency banding, the method includes creating a test pattern, sensing the test pattern with optical sensors, determining a beat frequency based on the sensed test pattern, and determining the frequency, phase and amplitude of high frequency banding based on the beat frequency. An exemplary embodiment of a feedback control method for controlling high frequency banding includes creating a test pattern, sensing the test pattern with optical sensors, measuring high frequency banding and adjusting the imaging parameters based on the measured high frequency banding in order to decrease the extent of high frequency banding. Moreover, an exemplary embodiment of a system for measuring high frequency banding includes an image marking device having a receiving member, optical sensors arranged on the receiving member, and a controller that is functionally coupled to the optical sensors and to the marking device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.