Patent · US Expired

Method and apparatus for measuring viscosity

US7284413B2 · kind B2 · utility

1Cited by

4References

30Claims

0Family size

Inventors

Rudolf Ehwald · Berlin, DE
Karl-Ernst Ehwald · Frankfurt, DE
Dieter Knoll · Frankfurt (Oder), DE
Wolfgang Winkler · Dresden, DE
Henning Zinke · Frankfurt (Oder), DE

Key dates

Filing date	May 28, 2001
Grant date	Oct 23, 2007
Priority date	—
Expiry date	May 28, 2021

Classification

Technology area (CPC G)Physics
CPC primaryG01N2203/0094
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An apparatus for measuring the viscosity of a fluid having a first rigid member extending from a body of semiconductor material and provided with a first conductive path and a second resiliently flexible member provided with a second conductive path and arranged in cantilever fashion over the rigid member. At least one of the conductive paths may be selectively energized to brig about relative movement between the rigid and flexible member. Subsequent deenergization of the path causes the resiliently flexible member to return to its initial position, the rate of return being measured to derive a signal representative of the viscosity. Also described are methods of carrying out the measurement and of fabricating the apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.