Arrayed sensor measurement system and method
US7286221B2 · kind B2 · utility
23Cited by
13References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2004 |
| Grant date | Oct 23, 2007 |
| Priority date | — |
| Expiry date | Oct 20, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Optical interrogation systems and methods are described herein that are capable of measuring the angles (or changes in the angles) at which light reflects, transmits, scatters, or is emitted from an array of sensors or specimens that are distributed over a large area 2-dimensional array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.