Patent · US Expired

Method and apparatus for tomosynthesis image quality control

US7286631B2 · kind B2 · utility

4Cited by
7References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 25, 2006
Grant dateOct 23, 2007
Priority date
Expiry dateFeb 16, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2211/436
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

A method and apparatus for tomosynthesis image quality control for a tomosynthesis imaging system. The method and apparatus including: positioning a phantom having an edge of predetermined sharpness at a predetermined angle relative to an imaging plane of an x-ray detector; performing tomosynthesis acquisition and generating one or more slice images using one or more three-dimensional reconstruction algorithms; selecting a slice image to be measured from the one or more slice images; identifying a sharpest edge in the slice image to be measured, wherein the sharpest edge in the slice image to be measured includes the in-focus portion of the phantom; inputting the slice image to be measured and coordinates of the sharpest edge in the slice image to be measured into a modulation transfer function (MTF) algorithm; and, using the MTF algorithm, calculating the in-plane resolution and slice thickness of the slice image to be measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.