Calibration pattern unit
US7286698B2 · kind B2 · utility
3Cited by
4References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2003 |
| Grant date | Oct 23, 2007 |
| Priority date | — |
| Expiry date | Nov 8, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/80
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system comprises a calibration pattern which has a known geometric pattern formed on a plurality of three-dimensionally arranged planes, and a relative position and posture fixing section which fixes relative position and posture between the calibration pattern and the imaging system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.