Apparatus and method for identifying possible defect indicators for a valve
US7286945B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 19, 2003 |
| Grant date | Oct 23, 2007 |
| Priority date | — |
| Expiry date | Dec 1, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/0221
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method, apparatus, and computer program are provided for identifying possible indicators of a defective valve. The method, apparatus, and computer program decompose a signal having a plurality of process variable measurements into a plurality of resolution levels. The process variable measurements are associated with operation of a valve. The method, apparatus, and computer program group the resolution levels into a plurality of groups. The method, apparatus, and computer program identify one or more defect indicators for at least some of the resolution levels using the groups. The one or more defect indicators are associated with a possible defect in the valve.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.