Patent · US Expired

Memory unit test

US7287204B2 · kind B2 · utility

7Cited by

11References

12Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Frank Mayer · Bad Dürkheim, DE
Kamal Merchant · Holzkirchen, DE

Key dates

Filing date	Oct 30, 2002
Grant date	Oct 23, 2007
Priority date	—
Expiry date	Apr 19, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/1008
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The invention relates to a method and device for operating and/or testing memory units, which make it possible to conduct a time-saving test of semiconductor memories during running operation. The inventive method for testing memory units having storage locations provides that, for the storage locations, a first item of test information is formed according to a variable parameter assigned to the respective storage location and according to the contents of the respective storage location.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.