System, method, and apparatus for dynamic electrical testing of workpieces by multiplexing test sites with shared electronics
US7288935B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 15, 2005 |
| Grant date | Oct 30, 2007 |
| Priority date | — |
| Expiry date | Apr 22, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/455
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.