Patent · US Expired

Computerized method and device for calculating an orthogonal x-ray attenuation of a subject using a measured, x-ray attenuation reference

US7289595B2 · kind B2 · utility

0Cited by

0References

11Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Rainer Raupach · Heroldsbach, DE
Andreas Schaller · Wiesbaden, DE
Christoph Suss · Erlangen, DE
Heiko Wolf · Thalwil, CH

Key dates

Filing date	May 5, 2006
Grant date	Oct 30, 2007
Priority date	—
Expiry date	May 5, 2026

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S378/901
WIPO fieldMedical technology
WIPO sectorInstruments

Abstract

In method and module for calculation of an orthogonal x-ray attenuation of a subject using a measured reference x-ray attenuation in computed tomography, the reference x-ray attenuation and the orthogonal attenuation are provided as input quantities for an automatic dose control of the computed tomography apparatus. The positioning of the subject with regard to the rotation axis of the computed tomography apparatus is taken into account in the calculation of the orthogonal x-ray attenuation detection of the table height of the subject table.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.