Method and device for analyzing a technical system, in addition to a computer program product

US7289940B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Reinhold Altpeter · Erlangen, DE
• Georg Hoever · Birkenfeld, DE
• Ingo Weber · Sydney, AU

Key dates

• Filing date: Nov 14, 2003
• Grant date: Oct 30, 2007
• Expiry date: Jul 10, 2024

Classification

• Technology area (CPC G): Physics
• CPC primary: G01D1/16
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The inventive system is used to design a technical system, which is characterized by condition variables and by diagnostic variables. A measurement field comprising first measured variables is incorporated into the design of the technical system, said first measured variables being measured with a predetermined accuracy. In addition, second measured variables can be measured with a predetermined accuracy. According to the inventive method, sensitivity variables are determined for the first measured variables. To determine said sensitivity variables, the extent to which a modification of the measurement accuracy of the first measured variables influences at least one parameter is calculated and to determine the second sensitivity variables, the extent to which the measurement of the second measured variables influences at least one parameter is calculated. The measurement field is then modified in such a way that the accuracy of the measured variables is altered, the first measured variables are removed from the measurement field and/or the second measured variables are added to the measurement field.