Patent · US Expired

Method and apparatus for detecting faults in transparent material

US7292332B2 · kind B2 · utility

7Cited by

7References

27Claims

0Family size

Assignees

Schott AG · DE
Isra Vision Lasor GmbH · DE

Inventors

Klaus Gerstner · Mainz, DE
Clemens Ottermann · Hattersheim, DE
Thomas Zimmermann · Schaffhausen, CH
Josef Droste · Glandorf, DE

Key dates

Filing date	Mar 29, 2004
Grant date	Nov 6, 2007
Priority date	—
Expiry date	Dec 27, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/8962
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The method for detecting faults in transparent material includes irradiating a definite partial volume in the material with a first radiation source and coupling light into the material from a second source so that its optical path in the partial volume extends in the interior of the material. A fault in the partial volume is detected by light scattering, bright field absorption, and/or deflection of light of the first radiation source by the fault. The apparatus for detecting faults includes a first radiation source for illuminating a definite partial volume of the material, a detector for detecting light from this partial volume, and a second radiation source. The second radiation source is arranged in relation to the material so that the associated optical path in the partial volume passes exclusively in the interior of the material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.