Patent · US Expired

Optical interrogation system and method for 2-D sensor arrays

US7292333B2 · kind B2 · utility

2Cited by
9References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 5, 2005
Grant dateNov 6, 2007
Priority date
Expiry dateOct 21, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/553
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An optical interrogation system and method are described herein that can interrogate a two-dimensional (2D) array of optical sensors (e.g., grating coupled waveguide sensors) located in a 2D specimen plate (e.g., microplate).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.