Method and system for identifying manufacturing anomalies in a manufacturing system

US7292905B1 · kind B1 · utility

Assignee

• NCR Corporation · US

Inventors

• Douglas J. Durrant · Mission Viejo, US
• Bruce E. Aldridge · Oceanside, US
• Ross E. Gough · Lake Forest, US

Key dates

• Filing date: Mar 31, 2000
• Grant date: Nov 6, 2007
• Expiry date: Mar 31, 2020

Classification

• Technology area (CPC G): Physics
• CPC primary: G06Q10/06
• WIPO field: IT methods for management
• WIPO sector: Electrical engineering

Abstract

A method and system for identifying manufacturing anomalies in a manufacturing system comprising a plurality of products which are manufactured with a plurality of manufacturing parameters is disclosed. The system comprises a data mining program applied to the data warehouse for analyzing the stored manufacturing parameters to define a normal manufacturing parameter subset. The data mining program is further for detecting that at least one of the plurality of manufacturing parameters is excluded from the normal subset. The system further comprises a reporting means for reporting the at least one detected manufacturing parameter. The data mining program may further detect that a plurality of the manufacturing parameters are excluded from the first subset. The data mining program then analyzes the detected plurality of manufacturing parameters to define a second normal subset of the detected plurality of manufacturing parameters. The reporting means may then report the second normal subset of manufacturing parameters.