Apparatus and method for testing a reflector coating
US7295293B2 · kind B2 · utility
1Cited by
14References
33Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 21, 2005 |
| Grant date | Nov 13, 2007 |
| Priority date | — |
| Expiry date | Dec 28, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of testing a coating on a reflector having a first focal point includes placing a mirror at the first focal point of the reflector and angled to orient with an area on the coating. Electromagnetic (EM) radiation is directed to the mirror which then directs the EM radiation on the area. The EM radiation which is reflected from the coating is collected onto a sensor disposed at a second focal point. The intensity of the EM radiation collected on the sensor is detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.