Method for calibration independent defect correction in an imaging system
US7295345B2 · kind B2 · utility
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Key dates
| Filing date | Apr 29, 2003 |
| Grant date | Nov 13, 2007 |
| Priority date | — |
| Expiry date | Feb 15, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2330/10
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for applying defect correction and calibration to image data (100) in an imaging system using an area spatial light modulator (146), where a tone correction LUT (148′) is applied to the image data (100) to apply calibration correction before applying defect correction using a defect map (122) with an accompanying gain table (124). The tone correction LUT (148) is then applied to the image data in the image modulation assembly (140).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.