Method for measuring VCSEL reverse bias leakage in an optical module
US7295590B2 · kind B2 · utility
9Cited by
7References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 15, 2004 |
| Grant date | Nov 13, 2007 |
| Priority date | — |
| Expiry date | Sep 13, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/423
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Reverse bias leakage testing may be used to determine the health of a vertical cavity surface emitting laser (VCSEL). When VCSELs are integrated on a die with other electronic devices such testing may damage the other electronic devices or be prohibited by circuits on the die designed to protect the electronics from being reverse biased. Accordingly, reverse bias testing may be facilitated by providing a second ground pad, separate from the die ground pad, specific to the VCSEL.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.