Method for operating a primary beam stop
US7295650B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 18, 2006 |
| Grant date | Nov 13, 2007 |
| Priority date | — |
| Expiry date | Sep 18, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/2073
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron detector (6) for receiving radiation diffracted or scattered from the sample (4), wherein the source (1), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop (5; 31; 41) is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector. This protects the detector from the influence of the primary beam while allowing a maximum amount of diffracted or scattered radiation to reach the detector, wherein the beam stop can be easily adjusted to temporally changing properties of the beam optics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.